Title :
Probe modeling for millimeter-wave integrated-circuit horn antennas
Author :
Yong Guo ; Jung-Chih Chiao ; Potter, K.A. ; Rutledge, D.B.
Author_Institution :
Dept. of Electr. & Comput. Eng., Clemson Univ., SC, USA
Abstract :
In an effort to develop an antenna-mixer array based on the existing technology, various antenna probes inside pyramidal horns have been examined on scaled model-horns at microwave frequencies. Modeling results and design principles of these antenna probes are presented, which include the resonant impedance, the operating frequency, and the bandwidth of the horn antennas. These measurement results provide a guideline for designing probes for millimeter/submillimeter-wave integrated-circuit horn-antenna-mixer arrays. All the impedance measurements indicate that the presence of the horn increases the effective length of the probe element. They also indicate that the resonant frequencies can be controlled by changing the length of the probes or loading the probes, and that resonant resistances can be increased to a reasonable matching range by folding the probes. The fan-probe design indicates that the bandwidth can be increased by changing the probe width.<>
Keywords :
electric impedance measurement; horn antennas; microwave integrated circuits; microwave measurement; mixers (circuits); probes; antenna probes; antenna-mixer array; bandwidth; fan-probe design; horn antennas; impedance measurements; length; loading; matching range; measurement results; microwave frequencies; millimeter-wave integrated-circuit; operating frequency; probe element; probe width; pyramidal horns; resonant impedance; resonant resistances; scaled model-horns; submillimeter wave IC; Antenna measurements; Bandwidth; Horn antennas; Impedance; Microwave antenna arrays; Microwave frequencies; Microwave technology; Millimeter wave technology; Probes; Resonance;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1992. AP-S. 1992 Digest. Held in Conjuction with: URSI Radio Science Meeting and Nuclear EMP Meeting., IEEE
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-0730-5
DOI :
10.1109/APS.1992.221438