Title :
A `digital´ 6-bit ADC in 0.25 μm CMOS
Author :
Donovan, Conor ; Flynn, Michael P.
Author_Institution :
Nat. Microelectron. Res. Centr, Nat. Univ. of Ireland, Cork, Ireland
Abstract :
Traditionally, circuit designers have adopted analog techniques to overcome comparator offset in flash converters. These schemes usually have an adverse effect on area and power consumption, and more seriously do not scale easily to low voltage processes. We describe a digital technique, which removes the accuracy constraints from the comparators. With no analog matching requirement, the comparators can be small, fast and power efficient. A 6-bit prototype converter built in a standard 0.25 μm digital CMOS process occupies 1.2 mm2 and dissipates 110 mW from a 2.2 V supply at 300 Ms/s
Keywords :
CMOS digital integrated circuits; analogue-digital conversion; calibration; comparators (circuits); integrated circuit design; 0.25 micron; 110 mW; 2.2 V; 6 bit; CMOS ADC; accuracy constraints; calibration technique; comparator offset; digital CMOS process; digital technique; flash converters; power efficient comparators; Analog-digital conversion; CMOS analog integrated circuits; CMOS digital integrated circuits; Calibration; Capacitors; Energy consumption; Error correction; Geometry; Low voltage; Prototypes;
Conference_Titel :
Custom Integrated Circuits, 2001, IEEE Conference on.
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-6591-7
DOI :
10.1109/CICC.2001.929743