DocumentCode :
3189900
Title :
Analyzing of Phase Noise in CMOS LC Oscillators
Author :
Saeidi, R. ; Masoumi, N. ; Kalantari, F. ; Oskooei, M.S.
Author_Institution :
VLSI Research Group, University of Tehran
fYear :
2005
fDate :
13-15 Dec. 2005
Firstpage :
330
Lastpage :
337
Abstract :
Analyses of phase noise in differential cross coupled inductance-capacitance (LC) oscillators and single-ended Colpitts oscillators are presented. Various noise sources in these oscillators are identified, and then their effects on phase noise are analyzed. To simulate the Impulse Sensitivity and Noise Modulation Factor waveforms of the above mentioned oscillators, the direct impulse response measurement method of is implemented in HSpice. We simulated two different oscillators, using the same tank inductance and are tuned to oscillate at the center frequency of 1.8 GHz with a voltage source of 1.8 V in 0.18 RF CMOS process. The inductors have a quality factor of 5 at 1.8 GHz and operate in the current limited regime.
Keywords :
Noise measurement; oscillator noise; phase noise; phase-locked loops; voltage-controlled oscillators; Active noise reduction; Circuit topology; Integrated circuit noise; Noise generators; Noise measurement; Phase noise; Q factor; Radio frequency; Very large scale integration; Voltage-controlled oscillators; Noise measurement; oscillator noise; phase noise; phase-locked loops; voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics, 2005. ICM 2005. The 17th International Conference on
Print_ISBN :
0-7803-9262-0
Type :
conf
DOI :
10.1109/ICM.2005.1590096
Filename :
1590096
Link To Document :
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