• DocumentCode
    3189988
  • Title

    Melting and Cavity Growth in the Vicinity of Crack Tips Subjected to Short-Duration Current Pulses

  • Author

    Gallo, F. ; Satapathy, S. ; Chandar, K. Ravi

  • Author_Institution
    Univ. of Texas, Austin, TX
  • fYear
    2008
  • fDate
    10-13 June 2008
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The current-carrying conductors in an electromagnetic launcher are exposed to high currents that last for a few milliseconds. Surface cracks on the rails can generate large gradients in current in their vicinity and may result, in some instances, in localized melting and expulsion of rail material. Here, we report the results of a study in which the mechanical and electrical parameters of the process were monitored as a function of time and the evolution of melting and ejection was examined through high-speed photography.
  • Keywords
    electromagnetic launchers; melting; surface cracks; wear; cavity growth; crack tips; current-carrying conductors; electromagnetic launcher; melting; short-duration current pulses; surface cracks; Condition monitoring; Conducting materials; Geometry; Photography; Rails; Signal processing; Stress; Surface cracks; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Launch Technology, 2008 14th Symposium on
  • Conference_Location
    Victoria, BC
  • Print_ISBN
    978-1-4244-1832-9
  • Electronic_ISBN
    978-1-4244-1833-6
  • Type

    conf

  • DOI
    10.1109/ELT.2008.121
  • Filename
    4657681