Title :
Circuits for on-chip sub-nanosecond signal capture and characterization
Author :
Abaskharoun, Nazmy ; Roberts, Gordon W.
Author_Institution :
Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada
Abstract :
Two circuits for performing on-chip subnanosecond signal measurements are presented. The first is an on-chip digitizer capable of capturing high-bandwidth arbitrary periodic signals, The second is a specialized jitter measurement structure based on a Time-to-Digital Converter (TDC). Both circuits were successfully implemented in a 0.35 μm CMOS process. The digitizer is capable of capturing signals at an effective sampling rate of 1.6 GWz, while the jitter measurement device can measure jitter with an 18 ps resolution
Keywords :
CMOS integrated circuits; analogue-digital conversion; delays; integrated circuit measurement; integrated circuit testing; jitter; signal sampling; 0.35 micron; 1.6 GHz; 18 ps; CMOS process; high-bandwidth arbitrary periodic signals; jitter measurement structure; onchip digitizer; onchip sub-nanosecond signal capture; onchip sub-nanosecond signal characterization; onchip subnanosecond signal measurement circuits; sampling rate; time-to-digital converter; Bandwidth; Circuit testing; Integrated circuit measurements; Jitter; Rail to rail operation; Samarium; Sampling methods; System testing; System-on-a-chip; Voltage;
Conference_Titel :
Custom Integrated Circuits, 2001, IEEE Conference on.
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-6591-7
DOI :
10.1109/CICC.2001.929766
