• DocumentCode
    3190244
  • Title

    Low-cost, software-based self-test methodologies for performance faults in processor control subsystems

  • Author

    Almukhaizim, Sobeeh ; Petrov, Peter ; Orailoglu, Alex

  • Author_Institution
    Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    263
  • Lastpage
    266
  • Abstract
    A software-based testing methodology for processor control subsystems, targeting hard-to-test performance faults in high-end embedded and general-purpose processors, is presented. An algorithm for directly controlling, using the instruction-set architecture only, the branch-prediction logic, a representative example of the class of processor control subsystems particularly prone to such performance faults, is outlined. Experimental results confirm the viability of the proposed methodology as a low-cost and effective answer to the problem of hard-to-test performance faults in processor architectures
  • Keywords
    VLSI; automatic testing; fault location; integrated circuit testing; logic testing; microprocessor chips; program compilers; branch-prediction logic; general-purpose processors; hard-to-test performance faults; high-end embedded processors; instruction-set architecture; low-cost test methodologies; performance faults; processor architectures; processor control subsystems; software-based self-test methodologies; Application software; Built-in self-test; Circuit faults; Circuit testing; Costs; Design for testability; Integrated circuit testing; Process control; Software testing; Space technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits, 2001, IEEE Conference on.
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-6591-7
  • Type

    conf

  • DOI
    10.1109/CICC.2001.929769
  • Filename
    929769