DocumentCode
3190244
Title
Low-cost, software-based self-test methodologies for performance faults in processor control subsystems
Author
Almukhaizim, Sobeeh ; Petrov, Peter ; Orailoglu, Alex
Author_Institution
Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
fYear
2001
fDate
2001
Firstpage
263
Lastpage
266
Abstract
A software-based testing methodology for processor control subsystems, targeting hard-to-test performance faults in high-end embedded and general-purpose processors, is presented. An algorithm for directly controlling, using the instruction-set architecture only, the branch-prediction logic, a representative example of the class of processor control subsystems particularly prone to such performance faults, is outlined. Experimental results confirm the viability of the proposed methodology as a low-cost and effective answer to the problem of hard-to-test performance faults in processor architectures
Keywords
VLSI; automatic testing; fault location; integrated circuit testing; logic testing; microprocessor chips; program compilers; branch-prediction logic; general-purpose processors; hard-to-test performance faults; high-end embedded processors; instruction-set architecture; low-cost test methodologies; performance faults; processor architectures; processor control subsystems; software-based self-test methodologies; Application software; Built-in self-test; Circuit faults; Circuit testing; Costs; Design for testability; Integrated circuit testing; Process control; Software testing; Space technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits, 2001, IEEE Conference on.
Conference_Location
San Diego, CA
Print_ISBN
0-7803-6591-7
Type
conf
DOI
10.1109/CICC.2001.929769
Filename
929769
Link To Document