Title :
Behavioral modeling for timing, noise, and signal integrity analysis
Author :
Hayes, Jerry D. ; Wissel, Larry
Author_Institution :
IBM Microelectron., Essex Junction, VT, USA
Abstract :
I/O behavioral modeling in the form of IBIS models has gained wide acceptance in signal integrity analysis. While the IBIS model accurately represents the characteristics of the output pin at three fixed process corners, it does not model driver delay or account for variations in temperature, supply voltages, and input transition rate. In this paper, we present a behavioral modeling technique that captures driver delay for timing analysis, driver output characteristics for signal integrity, and pre-drive currents for noise and power grid analysis; all are functions of temperature, supply voltages, and input transition rate
Keywords :
circuit analysis computing; delay estimation; integrated circuit modelling; integrated circuit noise; timing; IBIS models; behavioral modeling; driver delay; driver output characteristics; input transition rate variations; noise analysis; power grid analysis; pre-drive currents; signal integrity analysis; supply voltage variations; temperature variations; timing analysis; Analytical models; Delay; Impedance; Intellectual property; Microelectronics; Power grids; Signal analysis; Temperature sensors; Timing; Voltage;
Conference_Titel :
Custom Integrated Circuits, 2001, IEEE Conference on.
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-6591-7
DOI :
10.1109/CICC.2001.929800
