• DocumentCode
    3190670
  • Title

    Detection of scale-invariant key points employing a resistive network

  • Author

    Yasukawa, Shodai ; Okuno, Hirotsugu ; Yagi, Takeshi

  • Author_Institution
    Div. of Electr., Electron. & Inf. Eng., Osaka Univ., Suita, Japan
  • fYear
    2012
  • fDate
    16-18 Dec. 2012
  • Firstpage
    877
  • Lastpage
    882
  • Abstract
    We assessed the feasibility of applying a resistive network (RN) filter to the scale-invariant feature transform (SIFT) algorithm by performing computer simulations for the hardware implementation of the filter. SIFT is an algorithm for computer vision to describe and detect local features that are invariant to scale and rotation of objects. However, it is difficult to perform multiple spatial filterings in SIFT algorithm in real time due to its high computational cost. To solve this problem, we employed an RN which performs spatial filtering instantaneously with extremely low power dissipation. In order to apply an RN filter to the SIFT algorithm instead of Gaussian filter, which is employed in the original SIFT algorithm, we investigated the difference in the spatial properties of the two filters. We simulated the SIFT algorithm employing the RN filter on a computer, and we demonstrated that key points were detected at the same place irrespective of the image size, and that the scale of the key point was detected appropriately.
  • Keywords
    Gaussian processes; computer vision; filtering theory; object detection; object recognition; transforms; Gaussian filter; RN filter; SIFT algorithm; computer simulations; computer vision; local features; object detection; object recognition; resistive network filter; scale-invariant feature transform algorithm; scale-invariant key points; spatial filterings; Computational efficiency; Educational institutions; Feature extraction; Filtering algorithms; Histograms; Power dissipation; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    System Integration (SII), 2012 IEEE/SICE International Symposium on
  • Conference_Location
    Fukuoka
  • Print_ISBN
    978-1-4673-1496-1
  • Type

    conf

  • DOI
    10.1109/SII.2012.6427366
  • Filename
    6427366