• DocumentCode
    3190697
  • Title

    Modelling radiation from complex structures using a hybrid FDTD-BIE technique

  • Author

    Rogier, H. ; De Zutter, D. ; Olyslager, F.

  • Author_Institution
    Dept. of Inf. Technol., Univ. of Gent, Belgium
  • Volume
    4
  • fYear
    1998
  • fDate
    21-26 June 1998
  • Firstpage
    1808
  • Abstract
    A new hybrid finite-difference time-domain-boundary integral equation technique is proposed to model the radiation of complex three-dimensional structures involving current sources in the presence of metallic and dielectric objects. The simulation geometry is decomposed into several subregions. For homogeneous bounded and unbounded regions the 3D boundary integral technique is used. For each inhomogeneous subregion an interaction matrix is calculated at multiple frequencies using FDTD. Finally the different interaction matrices and source vectors are assembled into one global matrix equation by invoking continuity of the tangential electric and magnetic fields at all the interfaces between the subregions. An example is given to validate the new method.
  • Keywords
    boundary integral equations; electric fields; electromagnetic wave scattering; finite difference time-domain analysis; magnetic fields; matrix algebra; 3D structures; boundary integral equation; complex structures; current sources; dielectric objects; field continuity; finite-difference time-domain; global matrix equation; homogeneous bounded regions; homogeneous unbounded regions; hybrid FDTD-BIE technique; inhomogeneous subregion; interaction matrix; interfaces; metallic objects; radiation; scatterer; simulation geometry; source vectors; subregions; tangential electric field; tangential magnetic field; Assembly; Dielectrics; Finite difference methods; Frequency; Geometry; Integral equations; Matrix decomposition; Nonuniform electric fields; Solid modeling; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1998. IEEE
  • Conference_Location
    Atlanta, GA, USA
  • Print_ISBN
    0-7803-4478-2
  • Type

    conf

  • DOI
    10.1109/APS.1998.701553
  • Filename
    701553