• DocumentCode
    3190973
  • Title

    The effects of temperature on the tree growth phenomena and relevant PD

  • Author

    Bozzo, Riccardo ; Gemme, C. ; Guastavino, F.

  • Author_Institution
    Dept. of Electr. Eng., Genoa Univ., Italy
  • fYear
    1995
  • fDate
    22-25 Oct 1995
  • Firstpage
    69
  • Lastpage
    72
  • Abstract
    Electrical treeing tests at divergent field are a tool for the characterization of insulating materials which has been extensively studied in the recent years. The divergent field is generally obtained by means of point plane electrode geometries, where the point (needle) electrode can be either conductive or semiconductive. The main part of tests on this subject has been performed at ambient temperature, even though the service temperature of the insulation can be quite higher. In the paper it is shown how the temperature can affect both the different phases of the treeing phenomena (i.e. tree inception, tree growth and final breakdown) and the PD patterns, which are relevant to PDs acting inside the tree channels. Experiments have been performed on ethylen-vynilacetate copolymer (EVA) applying different constant AC voltage levels. Temperature effects on the time to tree inception, on the time to breakdown and on the tree growth are presented. Furthermore it is shown that PD patterns and their relevant statistical parameters can be significantly affected by a variation of temperature. In particular the variation versus time of some of the statistical parameters is temperature dependent
  • Keywords
    cable insulation; insulation testing; organic insulating materials; partial discharges; polymer blends; trees (electrical); PD patterns; constant AC voltage levels; divergent field; electrical treeing tests; ethylen-vynilacetate copolymer; insulating materials; point plane electrode geometries; statistical parameters; temperature effects; time to breakdown; tree growth phenomena; tree inception; Conducting materials; Dielectrics and electrical insulation; Electric breakdown; Electrodes; Geometry; Materials testing; Needles; Semiconductor materials; Temperature distribution; Trees - insulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1995. Annual Report., Conference on
  • Conference_Location
    Virginia Beach, VA
  • Print_ISBN
    0-7803-2931-7
  • Type

    conf

  • DOI
    10.1109/CEIDP.1995.483578
  • Filename
    483578