Wave tracing using near-field transforms

The authors discuss a technique, called wave tracing, for performing PO (physical optics) diffraction analysis at all points in the propagation path through a microwave optical system. This analysis is performed with two procedures: One traces the wave through the uniform medium between the reflecting or refracting optical surfaces. The other traces the wave through its encounter with one of the optical surfaces. In both cases the wave is traced from one plane to another plane. Every optical surface in the optical system will have two reference planes (which may be coincident) associated with it. Two applications of this wave tracing technique are discussed. One involves the application of microwave holography to the determination of the surface precision of an axially symmetric Cassegrain-reflector system. The second application illustrates the design analysis of an offset dual-reflector system which is fed by a phased array.<>