DocumentCode
31913
Title
Comparison Between Single Shot Micromachining of Silicon With Nanosecond Pulse Shaped IR Fiber Laser and DPSS UV Laser
Author
Kun Li ; Sparkes, M. ; O´Neill, W.
Author_Institution
Dept. of Eng., Univ. of Cambridge, Cambridge, UK
Volume
20
Issue
5
fYear
2014
fDate
Sept.-Oct. 2014
Firstpage
29
Lastpage
35
Abstract
High power DPSS UV lasers having high repetition rates (>100 kHz) are significant part of the cost of a laser Si micro-processing system. An alternative inexpensive solution, MOPA based IR fiber lasers, have been used to machine Si with high energy shaped pulses. This investigation evaluates the single pulse machining performance of a pulse shapeable IR (1062 nm) fiber laser and a DPSS UV (355 nm) laser on Si substrates and directly compares their performance. The machined depth data was measured with a white light interferometer and the finishing quality examined for surface defects with a SEM. Theoretical analysis demonstrated rapid heating effects by taking account of the dynamic optical and thermal properties of Si for given IR laser shaped pulses. The results show that high quality Si surface micro-processing can benefit from using the more flexible, more reliable, and pulse shapeable IR fiber laser at high repetition rates which no conventional solid state IR or UV laser could achieve.
Keywords
elemental semiconductors; high-speed optical techniques; laser beam machining; light interferometers; micromachining; scanning electron microscopy; silicon; surface finishing; IR laser shaped pulses; MOPA based IR fiber lasers; SEM; Si; Si substrates; dynamic optical properties; finishing quality; high energy shaped pulses; high power DPSS UV lasers; laser microprocessing system; machined depth data; nanosecond pulse shaped IR fiber laser; pulse shapeable IR fiber laser; rapid heating effects; repetition rate; single pulse machining performance; single shot micromachining; surface defects; surface microprocessing; thermal properties; wavelength 1062 nm; wavelength 355 nm; white light interferometer; Fiber lasers; Machining; Measurement by laser beam; Optical fibers; Optical surface waves; Silicon; Surface emitting lasers; DPSS UV laser; IR fiber laser; micromachining; optical/thermal dynamic properties; shaped pulse; silicon;
fLanguage
English
Journal_Title
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
1077-260X
Type
jour
DOI
10.1109/JSTQE.2013.2295352
Filename
6687309
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