Thin-film module measurement artifacts

A number of artifacts that affect the accuracy and meaning of characterization may be apparent in thin-film solar cell module measurements. Such artifacts are often negligible for small single thin-film solar cells or even single-crystal modules. Possible artifacts include artificially high or low cell series resistances during current-voltage measurements, artificially low quantum efficiencies, artificially low module currents or cell voltages and misleading signals from selective illumination measurements