Title :
High susceptibility domain configuration in micron-sized ferromagnetic stripes
Author :
Petck, B. ; Chang, J.-W. ; Jahnes, C.V. ; Lo, J. ; Trouiloud, P.L.
Author_Institution :
IBM Research Division
Keywords :
Current measurement; Frequency measurement; Magnetic domains; Micromagnetics; Optical films;
Conference_Titel :
Magnetics Conference, 1993. INTERMAG '93., Digest of International
Conference_Location :
Stockhom, Sweden
Print_ISBN :
0-7803-1310-0
DOI :
10.1109/INTMAG.1993.642743
