Title :
Development environment for designing and testing inspection systems
Author :
Brzakovic, D. ; Vujovic, N.
Author_Institution :
Dept. of Comput. Sci. & Electr. Eng., Lehigh Univ., Bethlehem, PA, USA
Abstract :
This paper describes the development environment for the design and testing of an expert system for web material inspection. The environment incorporates five sub-systems: sensing, detection, characterization, feature analysis, and classification. Each sub-system consists of a number of modules targeted at performing specific functions and containing adaptive image processing and pattern recognition algorithms. An example of defect classification in web materials is considered. The results are summarized and interpreted
Keywords :
automatic optical inspection; adaptive image processing; adaptive pattern recognition; characterization; defect classification; detection; development environment; expert system; feature analysis; inspection systems design; inspection systems testing; modules; sensing; web material inspection; Computer vision; Costs; Electrical equipment industry; Expert systems; Image processing; Inspection; Materials testing; Pattern recognition; Quality control; System testing;
Conference_Titel :
Pattern Recognition, 1994. Vol. 3 - Conference C: Signal Processing, Proceedings of the 12th IAPR International Conference on
Conference_Location :
Jerusalem
Print_ISBN :
0-8186-6275-1
DOI :
10.1109/ICPR.1994.577205
