• DocumentCode
    3191411
  • Title

    An Efficient Method for Fast Delay and SI Calculation Using Current Source Models

  • Author

    Wang, Xin ; Kasnavi, Ali ; Levy, Harold

  • Author_Institution
    Synopsys Inc., Mountain View
  • fYear
    2008
  • fDate
    17-19 March 2008
  • Firstpage
    57
  • Lastpage
    61
  • Abstract
    Current source models are the methods of choice for gate-level delay and SI calculation in Deep Sub Micron regime. To fully utilize the information provided by the current source models, numerical integration is often applied to solve stage-based transient simulation that calculates delay, slew, or noise bumps. However, this is computationally expensive. In this paper, we present a fast and robust algorithm for delay and signal integrity (SI) calculation using current source models. By applying diagonalization and Sherman-Morrison formula together with a one-step Newton-Raphson method, the transient simulation cost of a stage with a single driver can be reduced from O(kmn3) to O(kn) with a small runtime overhead, where k is the number of time step, m is the average number of Newton-Raphson steps, and n is the size of matrices of the Reduced Order Model(ROM) of the parasitic network. The proposed method works perfectly with the popular implicit integration methods such as the Trapezoidal and Backward Euler method.
  • Keywords
    Newton-Raphson method; constant current sources; delay circuits; Newton Raphson method; Sherman Morrison formula; backward Euler method; current source models; diagonalization; fast delay; integration methods; parasitic network; reduced order model; signal integrity calculation; transient simulation cost; trapezoidal method; Capacitance; Carbon capture and storage; Computational efficiency; Computational modeling; Costs; Delay; Newton method; Robustness; Runtime; Timing; Delay calculation; SI; gate-level analysis.; transient simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-0-7695-3117-5
  • Type

    conf

  • DOI
    10.1109/ISQED.2008.4479698
  • Filename
    4479698