Title :
Multiple scattering from radiation distributions of individual rough surface scatterers
Author :
Bahar, E. ; El-Shenawee, M.
Author_Institution :
Dept. of Electr. Eng., Nebraska Univ., Lincoln, NE, USA
Abstract :
The full-wave approach is used to compute the single and the double scattered intensities from random rough surfaces. The surface is assumed to consist of random distributions of individual rough surface scatterers with different mean square height, slope, and mean depth. The results show that the double backscattered intensity is significant for normal incidence if the mean square slope is large and the scatterer is highly conducting.<>
Keywords :
backscatter; electromagnetic wave scattering; conducting scatterer; double backscattered intensity; double scattered intensities; full wave method; mean depth; mean square height; multiple scattering; normal incidence; radiation distributions; random rough surfaces; rough surface scatterers; single scattered intensity; slope; Fluctuations; Probability density function; Random variables; Rough surfaces; Scattering; Surface roughness; Surface waves;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1992. AP-S. 1992 Digest. Held in Conjuction with: URSI Radio Science Meeting and Nuclear EMP Meeting., IEEE
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-0730-5
DOI :
10.1109/APS.1992.221527
