DocumentCode
3191448
Title
Output Remapping Technique for Soft-Error Rate Reduction in Critical Paths
Author
Ding, Qian ; Wang, Yu ; Wang, Hui ; Luo, Rong ; Yang, Huazhong
Author_Institution
Tsinghua Univ., Beijing
fYear
2008
fDate
17-19 March 2008
Firstpage
74
Lastpage
77
Abstract
It is expected that the soft error rate (SER) of combinational logic will increase significantly. Previous solutions to mitigate soft errors in combinational logic suffer from delay penalty or area/power overhead. In this paper, we proposed an output remapping technique to reduce SER of critical paths. Experimental results show up to about 20X increase in Qcritical. So the SER is reduced significantly. This method does not introduce any delay penalty. The area/power overhead is limited as well. The output remapping method is based on our novel glitch width model. The analysis shows that output remapping technique works well along with technology scaling.
Keywords
combinational circuits; logic testing; radiation hardening (electronics); area overhead; combinational logic; critical paths; delay penalty; glitch width model; output remapping technique; power overhead; soft-error rate reduction; Alpha particles; Capacitance; Error analysis; Logic; Neutrons; Propagation delay; Pulse measurements; Redundancy; Space vector pulse width modulation; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on
Conference_Location
San Jose, CA
Print_ISBN
978-0-7695-3117-5
Type
conf
DOI
10.1109/ISQED.2008.4479701
Filename
4479701
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