• DocumentCode
    3191448
  • Title

    Output Remapping Technique for Soft-Error Rate Reduction in Critical Paths

  • Author

    Ding, Qian ; Wang, Yu ; Wang, Hui ; Luo, Rong ; Yang, Huazhong

  • Author_Institution
    Tsinghua Univ., Beijing
  • fYear
    2008
  • fDate
    17-19 March 2008
  • Firstpage
    74
  • Lastpage
    77
  • Abstract
    It is expected that the soft error rate (SER) of combinational logic will increase significantly. Previous solutions to mitigate soft errors in combinational logic suffer from delay penalty or area/power overhead. In this paper, we proposed an output remapping technique to reduce SER of critical paths. Experimental results show up to about 20X increase in Qcritical. So the SER is reduced significantly. This method does not introduce any delay penalty. The area/power overhead is limited as well. The output remapping method is based on our novel glitch width model. The analysis shows that output remapping technique works well along with technology scaling.
  • Keywords
    combinational circuits; logic testing; radiation hardening (electronics); area overhead; combinational logic; critical paths; delay penalty; glitch width model; output remapping technique; power overhead; soft-error rate reduction; Alpha particles; Capacitance; Error analysis; Logic; Neutrons; Propagation delay; Pulse measurements; Redundancy; Space vector pulse width modulation; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-0-7695-3117-5
  • Type

    conf

  • DOI
    10.1109/ISQED.2008.4479701
  • Filename
    4479701