• DocumentCode
    3191510
  • Title

    3-D full-package signal integrity analysis using domain decomposition method

  • Author

    Shao, Yang ; Peng, Zhen ; Lee, Jin-Fa

  • Author_Institution
    ElectroScience Lab., Ohio State Univ., Columbus, OH, USA
  • fYear
    2010
  • fDate
    25-27 Oct. 2010
  • Firstpage
    157
  • Lastpage
    160
  • Abstract
    Advances in integrated circuit and package technologies, such as the increase of the number of metal layers and 3-D stacking technique, have paved the way for faster speed and higher performance in today´s electronic products. However, whether the high-speed systems preserve signal integrity has become a crucial question for system designers. In this work, we introduce a systematic numerical simulation method for 3-D full package simulation. A non-conformal finite element domain decomposition method with second order transmission condition is proposed to iterative the matrix equation solution. Numerical results verify the analysis and demonstrate the effectiveness of the proposed method on a real-life 3-D full package signal integrity analysis.
  • Keywords
    finite element analysis; high-speed integrated circuits; integrated circuit packaging; iterative methods; 3D full package simulation; 3D full-package signal integrity analysis; 3D stacking technique; electronic products; high-speed systems; integrated circuit; iterative matrix equation solution; metal layers; nonconformal finite element domain decomposition method; package technology; second order transmission condition; system designers; systematic numerical simulation method; Accuracy; Computational modeling; Convergence; Equations; Finite element methods; Mathematical model; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging and Systems (EPEPS), 2010 IEEE 19th Conference on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-6865-2
  • Electronic_ISBN
    978-1-4244-6866-9
  • Type

    conf

  • DOI
    10.1109/EPEPS.2010.5642570
  • Filename
    5642570