DocumentCode
3191510
Title
3-D full-package signal integrity analysis using domain decomposition method
Author
Shao, Yang ; Peng, Zhen ; Lee, Jin-Fa
Author_Institution
ElectroScience Lab., Ohio State Univ., Columbus, OH, USA
fYear
2010
fDate
25-27 Oct. 2010
Firstpage
157
Lastpage
160
Abstract
Advances in integrated circuit and package technologies, such as the increase of the number of metal layers and 3-D stacking technique, have paved the way for faster speed and higher performance in today´s electronic products. However, whether the high-speed systems preserve signal integrity has become a crucial question for system designers. In this work, we introduce a systematic numerical simulation method for 3-D full package simulation. A non-conformal finite element domain decomposition method with second order transmission condition is proposed to iterative the matrix equation solution. Numerical results verify the analysis and demonstrate the effectiveness of the proposed method on a real-life 3-D full package signal integrity analysis.
Keywords
finite element analysis; high-speed integrated circuits; integrated circuit packaging; iterative methods; 3D full package simulation; 3D full-package signal integrity analysis; 3D stacking technique; electronic products; high-speed systems; integrated circuit; iterative matrix equation solution; metal layers; nonconformal finite element domain decomposition method; package technology; second order transmission condition; system designers; systematic numerical simulation method; Accuracy; Computational modeling; Convergence; Equations; Finite element methods; Mathematical model; Solid modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2010 IEEE 19th Conference on
Conference_Location
Austin, TX
Print_ISBN
978-1-4244-6865-2
Electronic_ISBN
978-1-4244-6866-9
Type
conf
DOI
10.1109/EPEPS.2010.5642570
Filename
5642570
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