The secondary electron emission simulation of insulators: relation with some material physical constants

We are dealing with secondary electron emission phenomena of insulators as they take place at the early stages of irradiation by a narrow electron beam. Charging effects are then negligible. Using a Monte Carlo simulation method, we follow the electronic trajectories by introducing the different interactions (elastic, electron-electron, electron-core and electron-phonon scattering). The secondary electron cascade and the charge trapping effect are taken into account. Quartz-α is considered as the reference material. Then we introduce miscellaneous values for various physical constants (electronic affinity, dielectric constant, trapping parameters, ...) and we study the resulting secondary yield. We can see in particular that the charge trapping parameters are preponderant factors. From the trapping site density values, we can understand why insulators with otherwise similar properties have different secondary emission yields. In fact, secondary electron emission is a revealing of the sample “story”