DocumentCode :
3191818
Title :
Toward DO-178B-compliant Test Models
Author :
Stallbaum, Heiko ; Rzepka, Mark
Author_Institution :
Paluno - The Ruhr Inst. for Software Technol., Univ. of Duisburg-Essen, Essen, Germany
fYear :
2010
fDate :
3-3 Oct. 2010
Firstpage :
25
Lastpage :
30
Abstract :
Model-based Testing (MBT) helps handle the growing complexity of software and reduces development effort by using tool support and automation. In this paper, we have addressed a major drawback for the application of MBT in the avionic domain: DO-178B compliance. DO-178B is the most relevant standard for the development of avionics software in civil aircraft. It has strong emphasis on requirements-based testing and traceability of life cycle data but does not consider new development methodologies like MBT. To facilitate the application of MBT in the avionics domain, in this paper, we introduce a new UML profile that can be used to extend standard UML test models for MBT with information that is relevant for DO-178B certification. Thus, these test models can serve as supporting artifacts in DO-178B certification and provide an explicit support for DO-178B certification in case MBT is applied. Some of the benefits of the UML profile for DO-178B compliant test models are illustrated in an application scenario.
Keywords :
Unified Modeling Language; aircraft; avionics; computational complexity; program testing; program verification; software standards; DO-178B certification; DO-178B-compliant test models; UML test models; avionics software standard; civil aircraft; life cycle data traceability; model-based testing; requirements-based testing; software complexity; Aerospace electronics; Certification; Robustness; Safety; Software; Testing; Unified modeling language; Avionics; Avionics Software; Certification; DO-178B; Embedded Systems; Model-based Testing; Safety; Software Testing; Test Model; UML Profile;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Model-Driven Engineering, Verification, and Validation (MoDeVVa), 2010 Workshop on
Conference_Location :
Oslo
Electronic_ISBN :
978-0-7695-4384-0
Type :
conf
DOI :
10.1109/MoDeVVa.2010.21
Filename :
5772247
Link To Document :
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