DocumentCode :
3192024
Title :
Increasing data TLB resilience to transient errors
Author :
Li, Feihui ; Kandemir, Mahmut
Author_Institution :
Comput. Sci. & Eng., Pennsylvania State Univ., USA
fYear :
2005
fDate :
11-12 May 2005
Firstpage :
297
Lastpage :
298
Abstract :
This paper first demonstrates that a large fraction of data TLB entries are dead (i.e., not used again before being replaced) for many applications at any given time during execution. Based on this observation, it then proposes two alternate schemes that replicate actively accessed data TLB entries in these dead entries to increase the resilience of the TLB against transient errors.
Keywords :
cache storage; data structures; digital storage; memory architecture; data TLB resilience; data access; dead data TLB entries; transient errors; Application software; Computer errors; Computer science; Data engineering; Error analysis; Error correction; Error-free operation; Hardware; Protection; Resilience;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI, 2005. Proceedings. IEEE Computer Society Annual Symposium on
Print_ISBN :
0-7695-2365-X
Type :
conf
DOI :
10.1109/ISVLSI.2005.43
Filename :
1430162
Link To Document :
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