DocumentCode
3192026
Title
Study of Voltage Regulator noise characterization, coupling scheme and simulation method
Author
Mao, Wenjie ; He, Jiangqi ; Standford, Edward ; Li, YL
Author_Institution
Data Center Group, EPSD, Intel Asia-Pacific R&D Ltd., Shanghai, China
fYear
2010
fDate
25-27 Oct. 2010
Firstpage
201
Lastpage
204
Abstract
Signal Integrity (SI) and Power Integrity (PI) issues caused by on-board Voltage Regulator (VR) interfering always leads to system reliability problem. Prediction of this VR noise is very difficult due to its complexity. This paper addresses a two-step simulation method associated with this issue by identifying radiation source and coupling path. A typical PCB routing is studied and result is correlated with measurement.
Keywords
circuit noise; circuit simulation; network routing; printed circuit design; voltage regulators; PCB routing; coupling scheme; on board voltage regulator; power integrity; signal integrity; simulation method; system reliability; voltage regulator noise characterization; Couplings; Electromagnetic interference; FETs; Mathematical model; Noise; Noise measurement; Synchronization; EMI/RFI Simulation; Power Integrity; Signal Integrity; Voltage Regulator Noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2010 IEEE 19th Conference on
Conference_Location
Austin, TX
Print_ISBN
978-1-4244-6865-2
Electronic_ISBN
978-1-4244-6866-9
Type
conf
DOI
10.1109/EPEPS.2010.5642599
Filename
5642599
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