Improvement of near-field scanning optical microscope and observation of optical waveguide

Author

Kim, Ki Hyun ; Lee, Byongho ; Jhe, Wonho

Author_Institution

Dept. of Phys., Seoul Nat. Univ., South Korea

Volume

2

fYear

1997

fDate

10-13 Nov 1997

Firstpage

52

Abstract

Optical near-fields are widely studied to overcome the diffraction limit of conventional optics. Near-field scanning optical microscopes (NSOM), one of the optical near-field instruments, was fabricated and improved. The shear force mechanism is used for the tip-sample distance control which is basic requirement in near-field applications. In this work, the detection mechanism and feedback control of shear force were improved by a fiber detection scheme and a digital feedback controller

Keywords

optical feedback; optical fibres; optical microscopes; optical scanners; detection mechanism; diffraction limit; digital feedback controller; feedback control; fiber detection scheme; near-field applications; near-field scanning optical microscope; near-field scanning optical microscopes; optical near-field instrument; optical near-fields; optical waveguide; shear force mechanism; tip-sample distance control; Adaptive control; Etching; Force feedback; Instruments; Optical feedback; Optical fibers; Optical microscopy; Optical sensors; Optical waveguides; Scanning electron microscopy;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics Society Annual Meeting, 1997. LEOS '97 10th Annual Meeting. Conference Proceedings., IEEE

Conference_Location

San Francisco, CA

ISSN

1092-8081

Print_ISBN

0-7803-3895-2

Type

conf

DOI

10.1109/LEOS.1997.645235

Filename

645235