• DocumentCode
    3192729
  • Title

    A Robust and Efficient Pre-Silicon Validation Environment for Mixed-Signal Circuits on Intel´s Test Chips

  • Author

    August, Nathaniel

  • Author_Institution
    Intel Corp., Santa Clara
  • fYear
    2008
  • fDate
    17-19 March 2008
  • Firstpage
    423
  • Lastpage
    428
  • Abstract
    In the past, it was possible to validate analog CMOS circuits through transistor-level (schematic netlist) simulation. As manufacturing processes grow in complexity, the ever-increasing amount of design-for-test/manufacturability/yield/quality (DFx) circuitry renders transistor-level simulation impractical; and digital behavioral simulation ignores crucial analog interactions. This paper presents a more robust and efficient methodology for pre-silicon validation of such mixed-signal circuits. We adopt a top-down strategy and model all blocks at the behavioral level. However, we also represent select analog blocks at the transistor level. This strategy precludes the need for what is currently a weakness in mixed-signal validation - equivalence checking between analog behavioral models and analog schematics. In addition, this strategy enables performance validation to be seamlessly integrated with functional validation. Further, by leveraging the industry standard languages of SPICE, System Verilog and Verilog-AMS, we are able to build and simulate all modeling and validation constructs with a single tool. On Intel´s most recent test chip, our validation methodology found more bugs with fewer person-hours than previous attempts with purely digital or transistor-level validation.
  • Keywords
    CMOS analogue integrated circuits; circuit simulation; design for manufacture; design for testability; integrated circuit design; integrated circuit modelling; mixed analogue-digital integrated circuits; Intel test chips; SPICE; System Verilog; Verilog-AMS; analog CMOS circuits; analog behavioral models; analog blocks; analog schematics; behavioral level; design for manufacturability; design for quality; design for yield; design-for-test; digital behavioral simulation; equivalence checking; industry standard languages; manufacturing process; mixed-signal circuits; pre-silicon validation environment; transistor-level simulation; CMOS analog integrated circuits; Circuit simulation; Circuit testing; Computer bugs; Design for testability; Hardware design languages; Manufacturing processes; Robustness; SPICE; Virtual manufacturing; mixed-signal; pre-silicon; validation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-0-7695-3117-5
  • Type

    conf

  • DOI
    10.1109/ISQED.2008.4479769
  • Filename
    4479769