Abstract :
The following topics are dealt with: VLSI; system-on-chip; integrated circuit design; green computing; logic synthesis; logic testability; design for test; network-on-chip; and DSP.
Keywords :
VLSI; design for testability; digital signal processing chips; integrated circuit design; logic design; logic testing; system-on-chip; DSP; VLSI; design for test; green computing; integrated circuit design; logic synthesis; logic testability; network-on-chip; system-on-chip;
Conference_Titel :
VLSI System on Chip Conference (VLSI-SoC), 2010 18th IEEE/IFIP
Conference_Location :
Madrid
Print_ISBN :
978-1-4244-6469-2
DOI :
10.1109/VLSISOC.2010.5642634
