• DocumentCode
    3192842
  • Title

    Statistical Crosstalk Noise Analysis Using First Order Parameterized Approach for Aggressor Grouping

  • Author

    Shrivastava, Sachin ; Parameswaran, Harindranath

  • Author_Institution
    Cadence Design Syst. Pvt. Ltd., Delhi
  • fYear
    2008
  • fDate
    17-19 March 2008
  • Firstpage
    445
  • Lastpage
    449
  • Abstract
    With decreasing process nodes and increasing design density, crosstalk analysis is a must for getting design closure in the UDSM era. In addition to this, while crosstalk analysis is complex in itself, the new process nodes are showing increasing variations of process parameters for devices and interconnect. This in turn adds more complexity to crosstalk analysis. Standard techniques of factoring in the effects of process variations (corner-based analysis) is particularly ineffective for crosstalk analysis, so we need to look at techniques of statistical analysis of crosstalk in a manner similar to that used for timing. We look at a basic infrastructure for doing statistical crosstalk analysis - and look at how it can incorporate the effects of variations in cell variations and on aggressor slew. We also look at aggressor window clustering as a technique to reduce pessimism in crosstalk - and see how this technique can be modified to take in the effect of process variations. We lay the theoretical framework for these techniques in this paper, and show the results of a prototype implementation on real designs. We show that using this framework and techniques shows a close correlation with Monte-Carlo simulations.
  • Keywords
    Monte Carlo methods; integrated circuit design; integrated circuit noise; statistical analysis; Monte-Carlo simulation; aggressor grouping; aggressor slew; aggressor window clustering; cell variations; process parameter variations; statistical crosstalk noise analysis; ultra deep submicron technology; Crosstalk; Probability distribution; Prototypes; Statistical analysis; Timing; aggressor grouping; statistical crosstalk;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-0-7695-3117-5
  • Type

    conf

  • DOI
    10.1109/ISQED.2008.4479774
  • Filename
    4479774