DocumentCode :
3192842
Title :
Statistical Crosstalk Noise Analysis Using First Order Parameterized Approach for Aggressor Grouping
Author :
Shrivastava, Sachin ; Parameswaran, Harindranath
Author_Institution :
Cadence Design Syst. Pvt. Ltd., Delhi
fYear :
2008
fDate :
17-19 March 2008
Firstpage :
445
Lastpage :
449
Abstract :
With decreasing process nodes and increasing design density, crosstalk analysis is a must for getting design closure in the UDSM era. In addition to this, while crosstalk analysis is complex in itself, the new process nodes are showing increasing variations of process parameters for devices and interconnect. This in turn adds more complexity to crosstalk analysis. Standard techniques of factoring in the effects of process variations (corner-based analysis) is particularly ineffective for crosstalk analysis, so we need to look at techniques of statistical analysis of crosstalk in a manner similar to that used for timing. We look at a basic infrastructure for doing statistical crosstalk analysis - and look at how it can incorporate the effects of variations in cell variations and on aggressor slew. We also look at aggressor window clustering as a technique to reduce pessimism in crosstalk - and see how this technique can be modified to take in the effect of process variations. We lay the theoretical framework for these techniques in this paper, and show the results of a prototype implementation on real designs. We show that using this framework and techniques shows a close correlation with Monte-Carlo simulations.
Keywords :
Monte Carlo methods; integrated circuit design; integrated circuit noise; statistical analysis; Monte-Carlo simulation; aggressor grouping; aggressor slew; aggressor window clustering; cell variations; process parameter variations; statistical crosstalk noise analysis; ultra deep submicron technology; Crosstalk; Probability distribution; Prototypes; Statistical analysis; Timing; aggressor grouping; statistical crosstalk;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
978-0-7695-3117-5
Type :
conf
DOI :
10.1109/ISQED.2008.4479774
Filename :
4479774
Link To Document :
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