• DocumentCode
    3192866
  • Title

    The UCLA bi-polar planar near-field scanner. I. An overview of measured results

  • Author

    Williams, L. ; Rahmat-Samii, Y.

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
  • fYear
    1992
  • fDate
    18-25 June 1992
  • Firstpage
    1526
  • Abstract
    The authors describe the UCLA bipolar technique and the associated data processing methods. Measured results are compared with those measured on a conventional far-field range. Some of the salient features of the near-field scanner are: simple mechanical design with no linear motion, uni-structure to eliminate misalignment of axes, probe rotator for despinning probe if desired, use of standard optical bench rotary tables, telescopic antenna pedestal to adjust probe/AUT (antenna under test) spacing, PC control of open-loop stepper motor drive, PC control of HP 8510 with balanced external mixers for low loss and large dynamic range, and large scan plane acquisition for given hardware and chamber. The measured antenna patterns shown demonstrate that this technique yields data commensurate with those measured on the conventional far-field range.<>
  • Keywords
    antenna radiation patterns; antenna testing; automatic test equipment; HP 8510; PC control; UCLA; antenna patterns; antenna under test; balanced external mixers; bipolar planar near field scanner; chamber; data processing methods; dynamic range; far-field range; hardware; low loss; measured results; mechanical design; open-loop stepper motor drive; optical bench rotary tables; probe; scan plane acquisition; telescopic antenna pedestal; Antenna measurements; Data processing; Motion control; Motor drives; Open loop systems; Optical control; Optical design; Optical losses; Probes; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1992. AP-S. 1992 Digest. Held in Conjuction with: URSI Radio Science Meeting and Nuclear EMP Meeting., IEEE
  • Conference_Location
    Chicago, IL, USA
  • Print_ISBN
    0-7803-0730-5
  • Type

    conf

  • DOI
    10.1109/APS.1992.221597
  • Filename
    221597