DocumentCode
3192942
Title
Lasing in GaAs1−x Bix /GaAs thin film cavity with low-temperature-dependent oscillation wavelength
Author
Tominaga, Yoriko ; Oe, Kunishige ; Yoshimoto, Masahiro
Author_Institution
Dept. of Electron., Kyoto Inst. of Technol., Kyoto, Japan
fYear
2010
fDate
26-30 Sept. 2010
Firstpage
205
Lastpage
206
Abstract
Lasing oscillation from GaAs1-xBix/GaAs thin film with Fabry-Perot cavity was performed for the first time by photo-pumping. The lasing emission peak energy decreased at a constant rate of -0.18 meV/K, which is only 40 % of the temperature coefficient of the GaAs band gap.
Keywords
Fabry-Perot interferometers; III-V semiconductors; energy gap; gallium arsenide; laser cavity resonators; optical pumping; semiconductor lasers; semiconductor thin films; Fabry-Perot cavity; GaAsBi-GaAs; lasing emission peak energy; lasing oscillation; low-temperature-dependent oscillation wavelength; photo-pumping; temperature coefficient; thin film cavity; Gallium arsenide; Laser excitation; Metals; Oscillators; Photonic band gap; Pump lasers; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Laser Conference (ISLC), 2010 22nd IEEE International
Conference_Location
Kyoto
ISSN
0899-9406
Print_ISBN
978-1-4244-5683-3
Type
conf
DOI
10.1109/ISLC.2010.5642640
Filename
5642640
Link To Document