DocumentCode
3193379
Title
Dependance of monopulse radar boresight error on incident E-field polarization
Author
Wilson, Capt Kelce S ; Pyati, Vittal P. ; Temple, Capt Michael A
Author_Institution
AF Inst. of Technol., Wright-Patterson AFB, OH, USA
fYear
1995
fDate
8-11 May 1995
Firstpage
568
Lastpage
572
Abstract
Boresight error (BSE), the angular difference between a target´s actual and radar-indicated position, is influenced by protective radomes used on airborne platforms. Research results have demonstrated a reliable computer modeling technique for predicting the BSE of electrically large radar-radome systems. This technique, based on a ray-trace receive formulation using geometric optics (GO), was extended to investigate the dependance of radome-induced BSE on various combinations of aperture scan angle, element polarization, and incident wave polarization. The results obtained compare very well with available empirical, published, and measured data for the specific scan angles and polarization cases considered. Generally, the BSE exhibits less dependance on incident wave polarization when the aperture elements are linearly polarized and a higher degree of sensitivity when aperture elements are circularly polarized
Keywords
airborne radar; electromagnetic fields; electromagnetic wave polarisation; geometrical optics; radar computing; radar signal processing; radomes; airborne platforms; aperture scan angle; circularly polarized elements; computer modeling technique; electrically large radar-radome systems; element polarization; geometric optics; incident E-field polarization; incident wave polarization; linearly polarized elements; measured data; military systems; monopulse processing systems; monopulse radar boresight error; protective radomes; ray-trace receive formulation; Apertures; Computer errors; Geometrical optics; Optical polarization; Predictive models; Protection; Radar; Radio frequency; Surface waves; Tellurium;
fLanguage
English
Publisher
ieee
Conference_Titel
Radar Conference, 1995., Record of the IEEE 1995 International
Conference_Location
Alexandria, VA
Print_ISBN
0-7803-2121-9
Type
conf
DOI
10.1109/RADAR.1995.522610
Filename
522610
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