Title :
A < 1 pJ sub-VT cardiac event detector in 65 nm LL-HVT CMOS
Author :
Rodrigues, Joachim Neves ; Akgun, Omer Can ; Öwall, Viktor
Author_Institution :
Electr. & Inf. Technol., Lund Univ., Lund, Sweden
Abstract :
This paper presents the hardware implementation of a wavelet based event detector for cardiac pacemakers. A high level energy estimation flow was applied to evaluate energy efficiency of standard-cell based designs, over several CMOS technology generations, from 180 to 65 nm, operated in the sub-threshold domain. The simulation results indicate a 65 nm low-leakage high-threshold (LL-HVT) CMOS technology as the favourable choice. Accordingly, the design was fabricated in 65 nm LL-HVT CMOS. Measurements validate the simulation results and prove that the circuit is fully functional down to a supply voltage of 250 mV. At the energy minimum voltage of 320 mV the circuit dissipates 0.88 pJ per sample at a clock rate of 20 kHz.
Keywords :
CMOS integrated circuits; detector circuits; integrated circuit design; pacemakers; LL-HVT CMOS technology; cardiac pacemakers; energy efficiency evaluation; frequency 20 kHz; high level energy estimation flow; low-leakage high-threshold CMOS technology; size 180 nm to 65 nm; standard-cell based designs; subVT cardiac event detector; voltage 250 mV; voltage 320 mV; wavelet based event detector; Application specific integrated circuits; CMOS integrated circuits; Clocks; Detectors; Energy dissipation; Inverters; Leakage current;
Conference_Titel :
VLSI System on Chip Conference (VLSI-SoC), 2010 18th IEEE/IFIP
Conference_Location :
Madrid
Print_ISBN :
978-1-4244-6469-2
DOI :
10.1109/VLSISOC.2010.5642669