• DocumentCode
    3193630
  • Title

    The dielectric response of polyimide to combined radiation, vacuum and thermal aging

  • Author

    Banford, H.M. ; Yufen, Wang ; Tedford, D.J. ; Given, M.J.

  • Author_Institution
    Scottish Univ. Res. & Reactor Centre, Glasgow, UK
  • fYear
    1995
  • fDate
    22-25 Oct 1995
  • Firstpage
    239
  • Lastpage
    242
  • Abstract
    Kapton (polyimide) is a material which enjoys a wide usage in space and the present work involves a study of some aspects of its dielectric behaviour after it has been subjected to an aging regime involving electromagnetic radiation, vacuum and temperature, these being some of the principle environmental conditions that materials on a space platform can experience. Following aging for a period of between six and eighteen months, test specimens were transferred to a space simulation chamber that provides an environment that can encompass high vacuum, temperature within the range 80-470 K and a 60Co gamma dose rate of 7.5 mGy/h at the specimens. Measurements were made of dielectric loss at low frequencies and pre-breakdown transient current pulses under direct stress. The results demonstrate that the different aging regimes produce different dielectric responses
  • Keywords
    ageing; dielectric losses; gamma-ray effects; organic insulating materials; polymer films; 80 to 470 K; Kapton; dielectric loss; dielectric response; electromagnetic radiation; polyimide; pre-breakdown transient current pulses; radiation aging; space environment; thermal aging; vacuum aging; Aging; Current measurement; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Electromagnetic radiation; Polyimides; Pulse measurements; Temperature distribution; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1995. Annual Report., Conference on
  • Conference_Location
    Virginia Beach, VA
  • Print_ISBN
    0-7803-2931-7
  • Type

    conf

  • DOI
    10.1109/CEIDP.1995.483707
  • Filename
    483707