Title :
Investigating the Design, Performance, and Reliability of Multi-Walled Carbon Nanotube Interconnect
Author :
Nieuwoudt, Arthur ; Massoud, Yehia
Author_Institution :
Rice Univ., Houston
Abstract :
In this paper, we develop a quantitative design technique for multi-walled carbon nanotube (MWCNT) based interconnect, which we utilize to examine the performance and reliability of future nanotube-based interconnect solutions. Leveraging an analytical RLC model for MWCNTs, we create the first closed-form formulation for the optimal nanotube diameter and nanotube bundle height. The results indicate that the proposed design method decreases delay by 21% and 29% on average compared to non-optimized MWCNTs and single-walled carbon nanotube (SWCNT) bundles. We also find that large diameter MWCNT bundles are significantly more susceptible to process variations than SWCNT bundles, which will have important reliability implications in future nano-scale ICs.
Keywords :
carbon nanotubes; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; integrated circuit reliability; nanoelectronics; RLC model; closed-form formulation; interconnect design; interconnect performance; interconnect reliability; multiwalled carbon nanotube interconnect; nanoscale ICs; Analytical models; Carbon nanotubes; Conductivity; Contact resistance; Copper; Delay; Design methodology; Integrated circuit interconnections; Predictive models; Wires; Mutli-walled carbon nanotubes; interconnect; interconnect reliability; nanotube interconnect;
Conference_Titel :
Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
978-0-7695-3117-5
DOI :
10.1109/ISQED.2008.4479821
