• DocumentCode
    3193662
  • Title

    Micropipeline-Based Asynchronous Design Methodology for Robust System Design Using Nanoscale Crossbar

  • Author

    Chakraborty, Rajat Subhra ; Bhunia, Swarup

  • Author_Institution
    Case Western Reserve Univ., Cleveland
  • fYear
    2008
  • fDate
    17-19 March 2008
  • Firstpage
    697
  • Lastpage
    701
  • Abstract
    System design with nanoscale molecular devices will require developing new circuit and architectural techniques to exploit highly dense and regular structures such as nano-crossbar. It also requires addressing some inherent limitations with these devices, such as large process variations, high defect rates, lack of voltage gain (preventing logic cascading), and large overhead of interfacing logic. We propose an asynchronous design paradigm for nanoscale crossbar that combines them with CMOS-based event- driven bistable elements to implement micropipeline structures. An automated design platform for synthesizing these systems is also presented. The proposed asynchronous design approach addresses three main issues with nanoscale crossbar: 1) parameter variations, 2) logic cascading, and 3) large overhead of interfacing logic. Simulation results show considerable improvement in robustness under variations as well as in total area (up to 1.8X), delay (up to 2X) and power (up to 3.2X) compared to equivalent sequential implementation.
  • Keywords
    CMOS integrated circuits; integrated circuit design; integrated logic circuits; logic design; nanoelectronics; CMOS-based event-driven bistable elements; defect rates; interfacing logic; logic cascading; micropipeline structures; micropipeline-based asynchronous design methodology; nanoscale crossbar; nanoscale molecular devices; voltage gain; CMOS logic circuits; Design methodology; Diodes; Fabrication; Fabrics; Logic design; Logic devices; Nanoscale devices; Nanostructures; Robustness; Asynchronous design; CMOSNano; Diode-resistor logic;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-0-7695-3117-5
  • Type

    conf

  • DOI
    10.1109/ISQED.2008.4479822
  • Filename
    4479822