DocumentCode :
3193744
Title :
Effects of thermal and electrical stressing on the breakdown behavior of space wiring
Author :
Hammoud, Ahmad ; Staven, M. ; Suthar, Jayant ; Laghari, Javaid
Author_Institution :
NASA Lewis Res. Center, Nyma Inc., Cleveland, OH, USA
fYear :
1995
fDate :
22-25 Oct 1995
Firstpage :
266
Lastpage :
269
Abstract :
Several failures in the electrical wiring systems of many aircraft and space vehicles have been attributed to arc tracking and damaged insulation. In some instances, these failures proved to be very costly as they have led to the loss of many aircraft and imperilment of space missions. Efforts are currently underway to develop lightweight, reliable, and arc track resistant wiring for aerospace applications. In this work, six wiring constructions were evaluated in terms of their breakdown behavior as a function of temperature. These hybrid constructions employed insulation consisting of Kapton, Teflon, and cross-linked Tefzel. The properties investigated included the 400 Hz AC dielectric strength at ambient and 200°C, and the lifetime at high temperature with an applied bias of 40, 60, and 80% of breakdown voltage level. The results obtained are discussed, and conclusions are made concerning the suitability of the wiring constructions investigated for aerospace applications
Keywords :
aerospace; aircraft; cable insulation; electric breakdown; electric strength; failure analysis; insulation testing; life testing; organic insulating materials; space vehicles; thermal stresses; wiring; 200 C; 400 Hz; AC dielectric strength; Kapton; Teflon; aerospace applications; aircraft; arc track resistant wiring; breakdown behavior; cross-linked Tefzel; electrical stressing; electrical wiring systems; high temperature; lifetime; space vehicles; space wiring; thermal stressing; Aircraft manufacture; Dielectric breakdown; Dielectrics and electrical insulation; Electric breakdown; Insulation life; Space missions; Space vehicles; Temperature; Thermal stresses; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1995. Annual Report., Conference on
Conference_Location :
Virginia Beach, VA
Print_ISBN :
0-7803-2931-7
Type :
conf
DOI :
10.1109/CEIDP.1995.483714
Filename :
483714
Link To Document :
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