Title :
Time-domain interleaved high sampling rate system for large signal characterization of non-linear devices
Author :
Ahmed, S. ; Neveux, G. ; Reveyrand, T. ; Barataud, D. ; Nebus, J.M.
Author_Institution :
XLIM, Univ. of Limoges, Limoges, France
Abstract :
This paper proposes a high sampling rate, 4-channel Track and Hold Amplifier based time-domain measurement setup. It achieves an equivalent high sampling rate using Coherent Time Interleaved Sampling (CTIS) technique to accurately characterize high Power amplifiers driven by repetitive pulsed RF large signal. The acquired samples are the combination of non-sequential sub-sampling technique and the measurement system based on the use of Track and Hold amplifiers to avoid Intermediate Frequency (IF) aliasing and IF filtering. This principle is applied to the large signal pulsed characterization of S-band 50 W GaN amplifier. Fully calibrated acquired time-domain waveforms and power characteristics under varying load conditions are presented. To the authors knowledge the transients at the beginning and end of pulses are measured and exhibited for the first time.
Keywords :
III-V semiconductors; gallium compounds; power amplifiers; radiofrequency amplifiers; sample and hold circuits; signal sampling; time-domain analysis; wide band gap semiconductors; 4-channel track and hold amplifier; CTIS technique; GaN; IF aliasing; IF filtering; S-band amplifier; calibration; coherent time interleaved sampling technique; high power amplifier; intermediate frequency aliasing; large signal characterization; measurement system; nonlinear device; nonsequential subsampling technique; power 50 W; repetitive pulsed RF large signal; sample acquisition; time-domain interleaved high sampling rate system; time-domain measurement setup; time-domain waveform; Pulse measurements; Radio frequency; Time domain analysis; Time frequency analysis; Transient analysis; Voltage measurement; Non-Linear devices; Time-domain measurements; Track and hold amplifier; virtual sampling Frequency;
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2012 79th ARFTG
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4673-1229-5
Electronic_ISBN :
978-1-4673-1230-1
DOI :
10.1109/ARFTG79.2012.6291189