DocumentCode :
3193986
Title :
Noise temperature of an electronic tuner for noise parameter measurement systems
Author :
Axelsson, Olle ; Thorsell, Mattias ; Andersson, Kristoffer ; Stenarson, Jörgen ; Rolain, Yves
Author_Institution :
Microwave Electron. Lab., Chalmers Univ. of Technol., Göteborg, Sweden
fYear :
2012
fDate :
22-22 June 2012
Firstpage :
1
Lastpage :
2
Abstract :
In this paper, the noise temperature of an electronic tuner is determined and its significance for the suitability of such tuners in noise parameter measurement systems discussed. The noise temperature of the tuner was found to be higher than the ambient room temperature in the laboratory and vary significantly between tuner states. For impedance states with small input reflections coefficients, the excess noise temperature is around 25 K. For some of the states with higher reflection coefficients, this figure increases, reaching around 45 K at |Γ| = 0.75. Unless accounted for, this leads to errors in noise parameter extraction when using an electronic tuner in noise parameter measurements.
Keywords :
circuit tuning; electric noise measurement; temperature measurement; electronic tuner; noise parameter extraction; noise parameter measurement system; noise temperature; small input reflections coefficient; temperature 293 K to 298 K; Impedance; Measurement uncertainty; Noise; Noise measurement; Power measurement; Temperature measurement; Tuners;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2012 79th ARFTG
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4673-1229-5
Electronic_ISBN :
978-1-4673-1230-1
Type :
conf
DOI :
10.1109/ARFTG79.2012.6291197
Filename :
6291197
Link To Document :
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