• DocumentCode
    3193995
  • Title

    Quantified Impacts of Guardband Reduction on Design Process Outcomes

  • Author

    Jeong, Kwangok ; Kahng, Andrew B. ; Samadi, Kambiz

  • Author_Institution
    Univ. of California, San Diego
  • fYear
    2008
  • fDate
    17-19 March 2008
  • Firstpage
    790
  • Lastpage
    797
  • Abstract
    The value of guardband reduction is a critical open issue for the semiconductor industry. For example, due to competitive pressure, foundries have started to incent the design of manufacturing-friendly ICs through reduced model guardbands when designers adopt layout restrictions. The industry also continuously weighs the economic viability of relaxing process variation limits in the technology roadmap [2]. Our work gives the first-ever quantification of the impact of modeling guardband reduction on outcomes from the synthesis, place and route (SP&R) implementation flow. We assess the impact of model guard- band reduction on various metrics of design cycle time and design quality, using open-source cores and production (specifically, ARM/TSMC) 90 nm and 65 nm technologies and libraries. Our experimental data clearly shows the potential design quality and turnaround time benefits of model guardband reduction. For example, we typically (i.e., on average) observe 13% standard-cell area reduction and 12% routed wirelength reduction as the consequence of a 40% reduction in library model guardband; 40% is the amount of guardband reduction reported by IBM for a variation-aware timing methodology [8]. We also assess the impact of guardband reduction on design yield. Our results suggest that there is justification for the design, EDA and process communities to enable guardband reduction as an economic incentive for manufacturing-friendly design practices.
  • Keywords
    design for manufacture; integrated circuit design; integrated circuit economics; integrated circuit modelling; integrated circuit yield; IC design of manufacturing; cycle time design; design quality; design yield; economic incentive; guardband reduction modeling; library model guardband reduction; open-source cores; open-source production; routed wirelength reduction; semiconductor industry; size 65 nm; size 90 nm; standard-cell area reduction; synthesis-place-route implementation flow; variation-aware timing methodology; Electronics industry; Foundries; Industrial economics; Libraries; Manufacturing industries; Open source software; Process design; Production; Semiconductor device manufacture; Virtual manufacturing; Guardband; chip size; design iterations; runtime; wirelength; yield;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-0-7695-3117-5
  • Type

    conf

  • DOI
    10.1109/ISQED.2008.4479839
  • Filename
    4479839