DocumentCode :
3193995
Title :
Quantified Impacts of Guardband Reduction on Design Process Outcomes
Author :
Jeong, Kwangok ; Kahng, Andrew B. ; Samadi, Kambiz
Author_Institution :
Univ. of California, San Diego
fYear :
2008
fDate :
17-19 March 2008
Firstpage :
790
Lastpage :
797
Abstract :
The value of guardband reduction is a critical open issue for the semiconductor industry. For example, due to competitive pressure, foundries have started to incent the design of manufacturing-friendly ICs through reduced model guardbands when designers adopt layout restrictions. The industry also continuously weighs the economic viability of relaxing process variation limits in the technology roadmap [2]. Our work gives the first-ever quantification of the impact of modeling guardband reduction on outcomes from the synthesis, place and route (SP&R) implementation flow. We assess the impact of model guard- band reduction on various metrics of design cycle time and design quality, using open-source cores and production (specifically, ARM/TSMC) 90 nm and 65 nm technologies and libraries. Our experimental data clearly shows the potential design quality and turnaround time benefits of model guardband reduction. For example, we typically (i.e., on average) observe 13% standard-cell area reduction and 12% routed wirelength reduction as the consequence of a 40% reduction in library model guardband; 40% is the amount of guardband reduction reported by IBM for a variation-aware timing methodology [8]. We also assess the impact of guardband reduction on design yield. Our results suggest that there is justification for the design, EDA and process communities to enable guardband reduction as an economic incentive for manufacturing-friendly design practices.
Keywords :
design for manufacture; integrated circuit design; integrated circuit economics; integrated circuit modelling; integrated circuit yield; IC design of manufacturing; cycle time design; design quality; design yield; economic incentive; guardband reduction modeling; library model guardband reduction; open-source cores; open-source production; routed wirelength reduction; semiconductor industry; size 65 nm; size 90 nm; standard-cell area reduction; synthesis-place-route implementation flow; variation-aware timing methodology; Electronics industry; Foundries; Industrial economics; Libraries; Manufacturing industries; Open source software; Process design; Production; Semiconductor device manufacture; Virtual manufacturing; Guardband; chip size; design iterations; runtime; wirelength; yield;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
978-0-7695-3117-5
Type :
conf
DOI :
10.1109/ISQED.2008.4479839
Filename :
4479839
Link To Document :
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