What can the ABCD parameters tell us about the TRL?

Author

Reynoso-Hernández, J.A. ; Pulido-Gaytán, M.A. ; Maya-Sánchez, M.C. ; Loo-Yau, J.R.

Author_Institution

Centro de Investig. Cienc. y de Educ. Super. de Ensenada (CICESE), Ensenada, Mexico

fYear

2012

fDate

22-22 June 2012

Firstpage

1

Lastpage

4

Abstract

Using ABCD parameters and the 8-term error model to represent a non-ideal vector network analyzer (VNA), a new procedure for implementing the Thru-Reflect-Line calibration technique (TRL) is introduced. The novelty of this TRL is the use of ABCD-parameters, instead of transmission parameters, to represent a non-ideal vector network analyzer (VNA). Moreover, this new approach demonstrates, theoretically, the use of lines with complex characteristic impedance as calibration elements. To validate the new TRL procedure, the phase and magnitude of a waveguide sliding short is measured and corrected with the classical TRL. The results are in good agreement, which validates the proposed method.

Keywords

calibration; network analysers; waveguides; 8-term error model; ABCD parameter; TRL calibration technique; complex characteristic impedance; nonideal VNA; nonideal vector network analyzer; thru-reflect-line calibration technique; transmission parameter; waveguide sliding short magnitude measurement; Calibration; Frequency measurement; Impedance; Phase measurement; Scattering parameters; Standards; Vectors; ABCD-parameters; TRL calibration; offset short; waveguide sliding short; waveguides;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Measurement Conference (ARFTG), 2012 79th ARFTG

Conference_Location

Montreal, QC

Print_ISBN

978-1-4673-1229-5

Electronic_ISBN

978-1-4673-1230-1

Type

conf

DOI

10.1109/ARFTG79.2012.6291201

Filename

6291201