Analysis in 3-D of the complex and arbitrary bilateral finlines

Author

Fernandes, Humberto César Chaves ; Neto, J.de A.S.

Author_Institution

Dept. of Electr. Eng., Univ. Fed. do Rio Grande do Norte, Natal, Brazil

Volume

1

fYear

1997

fDate

11-14 Aug 1997

Firstpage

47

Abstract

An electromagnetic application is developed to obtain simultaneously the effective dielectric constant and the attenuation constant of arbitrary bilateral fin lines with semiconductor substrate and finite conductor thickness. Also the concise Transverse Transmission Line-TTL full wave method is used in the analysis. Results of the complex propagation as a function of the frequency and different dimensions and conductivity of the substrate, are obtained in 3-D

Keywords

fin lines; permittivity; waveguide theory; 3D analysis; TTL full wave method; attenuation constant; complex bilateral finlines; complex propagation; effective dielectric constant; finite conductor thickness; semiconductor substrate; transverse transmission line method; Attenuation; Boundary conditions; Conductors; Dielectric constant; Electromagnetic fields; Electromagnetic propagation; Equations; Finline; Frequency; Substrates;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave and Optoelectronics Conference, 1997. Linking to the Next Century. Proceedings., 1997 SBMO/IEEE MTT-S International

Conference_Location

Natal

Print_ISBN

0-7803-4165-1

Type

conf

DOI

10.1109/SBMOMO.1997.646794

Filename

646794