DocumentCode :
3194321
Title :
Stacked chip-to-chip interconnections using wafer bonding technology with dielectric bonding glues
Author :
Lü, J.Q. ; Kwon, Y. ; Kraft, R.P. ; Gutmann, R.J. ; McDonald, J.F. ; Gale, T.S.
Author_Institution :
Focus Center, Rensselaer Polytech. Inst., Troy, NY, USA
fYear :
2001
fDate :
6-6 June 2001
Firstpage :
219
Lastpage :
221
Abstract :
Three-dimensional (3D) interconnects offer the potential of reducing fabrication and performance limitations of future generations of planar ICs. This paper describes a specific approach, incorporating wafer alignment and wafer bonding of two 200-mm silicon wafers, along with subsequent processing steps. Our approach using dielectrics as the bonding glue layer provides a monolithic 3D interconnect process, which is fully compatible with back-end-of-the-line processing. This 3D technology enables heterogeneous systems, such as future electronic and photonic systems using a mix-and-match hard IP core design approach, and provides a high-density pin-out alternative to stacked chip-scale packages today.
Keywords :
integrated circuit interconnections; wafer bonding; 200 mm; BEOL processing; Si; dielectric bonding glue; heterogeneous system; mix-and-match hard IP core design; monolithic three-dimensional interconnect; planar IC; stacked chip-to-chip interconnection; wafer alignment; wafer bonding; Chip scale packaging; Design methodology; Dielectrics; Electronics packaging; Fabrication; Gold; Integrated circuit interconnections; Large scale integration; System-on-a-chip; Wafer bonding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Interconnect Technology Conference, 2001. Proceedings of the IEEE 2001 International
Conference_Location :
Burlingame, CA, USA
Print_ISBN :
0-7803-6678-6
Type :
conf
DOI :
10.1109/IITC.2001.930066
Filename :
930066
Link To Document :
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