• DocumentCode
    3194521
  • Title

    Full characterization of a semiconductor laser beam by simultaneous capture of the near- and far-field

  • Author

    Borgentun, C. ; Bengtsson, J. ; Larsson, A.

  • Author_Institution
    Dept. of Microtechnol. & Nanosci. (MC2), Chalmers Univ. of Technol., Göteborg, Sweden
  • fYear
    2010
  • fDate
    26-30 Sept. 2010
  • Firstpage
    127
  • Lastpage
    128
  • Abstract
    We present a new measurement technique for fully characterizing a semiconductor laser beam. The reflections from both surfaces of a plano-convex lens are used to simultaneously capture the near- and far-field. The optical phase is then retrieved using the Gerchberg-Saxton algorithm with improved numerical operations.
  • Keywords
    laser beams; lenses; numerical analysis; reflectivity; semiconductor lasers; Gerchberg-Saxton algorithm; numerical operations; optical phase; plano-convex lens; semiconductor laser beam; simultaneous capture; surface reflections; Charge coupled devices; Laser beams; Lenses; Measurement by laser beam; Optical reflection; Semiconductor device measurement; Semiconductor lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Laser Conference (ISLC), 2010 22nd IEEE International
  • Conference_Location
    Kyoto
  • ISSN
    0899-9406
  • Print_ISBN
    978-1-4244-5683-3
  • Type

    conf

  • DOI
    10.1109/ISLC.2010.5642720
  • Filename
    5642720
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3194521