DocumentCode
319460
Title
Measuring the scattering parameters of microwave devices
Author
de Oliveira, Antonio Jeronimo Belfort
Author_Institution
Centro de Tecnologia, Univ. Fed. de Pernambuco, Recife, Brazil
Volume
1
fYear
1997
fDate
11-14 Aug 1997
Firstpage
385
Abstract
A complete six-port network analyser is proposed that makes use of a single reflectometer. The proposed configuration employes a precision attenuator which dispenses with connections and disconnections with calibration standards, needs no inversion of the two-port device under test for measuring the transmission parameters and as its main feature, avoids the use of switches which are always present in the traditional configurations described in the literature. Its calibration and measurement procedures are also described
Keywords
S-parameters; calibration; microwave devices; microwave reflectometry; network analysers; calibration; measurement procedures; microwave devices; precision attenuator; scattering parameters; single reflectometer; six-port network analyser; Attenuators; Calibration; Costs; Electronic mail; Frequency; Microwave devices; Microwave measurements; Scattering parameters; Switches; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Optoelectronics Conference, 1997. Linking to the Next Century. Proceedings., 1997 SBMO/IEEE MTT-S International
Conference_Location
Natal
Print_ISBN
0-7803-4165-1
Type
conf
DOI
10.1109/SBMOMO.1997.646899
Filename
646899
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