An Efficient Overlapping Event Generation Method for Symmetric System Testing

In a time invariant system with finite events, the possible scenarios are defined by the events and the relative delay between the events. System behavior testing with overlapping events requires all non-redundant scenarios to be generated and utilized for testing. In this work, non-redundant set of scenarios are derived for a symmetric system. A method for generating the scenarios efficiently with granularity control is proposed. An example of the method applied for testing of a symmetric multiprocessing (SMP) multi-core system with multiple peripherals is given. We also describe the improvements for symmetric system method over asymmetric system.