• DocumentCode
    3195460
  • Title

    Improving the orthogonal range search k-windows algorithm

  • Author

    Alevizos, P. ; Boutsinas, B. ; Tasoulis, D. ; Vrahatis, M.N.

  • Author_Institution
    Dept. of Math., Patras Univ., Greece
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    239
  • Lastpage
    245
  • Abstract
    Clustering, that is the partitioning of a set of patterns into disjoint and homogeneous meaningful groups (clusters), is a fundamental process in the practice of science. k-windows is an efficient clustering algorithm that reduces the number of patterns that need to be examined for similarity. using a windowing technique. It exploits well known spatial data structures, namely the range free, that allows fast range searches. From a theoretical standpoint, the k-windows algorithm is characterized by lower time complexity compared to other well-known clustering algorithms. Moreover it achieves high quality clustering results. However, it appears that it cannot be directly applicable in high-dimensional settings due to the superlinear space requirements for the range tree. In this paper an improvement of the k-windows algorithm, aiming at resolving this deficiency, is presented. The improvement is based on an alternative solution to the orthogonal range search problem.
  • Keywords
    computational complexity; pattern clustering; search problems; spatial data structures; disjoint clusters; disjoint groups; homogeneous clusters; homogeneous groups; low time complexity; orthogonal range search k-windows algorithm; pattern clustering; pattern set partitioning; range free; range tree; spatial data structures; superlinear space requirements; Artificial intelligence; Clustering algorithms; Data mining; Databases; Iterative algorithms; Machine learning algorithms; Mathematics; Partitioning algorithms; Pattern analysis; Tree data structures;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Tools with Artificial Intelligence, 2002. (ICTAI 2002). Proceedings. 14th IEEE International Conference on
  • ISSN
    1082-3409
  • Print_ISBN
    0-7695-1849-4
  • Type

    conf

  • DOI
    10.1109/TAI.2002.1180810
  • Filename
    1180810