• DocumentCode
    3196287
  • Title

    Using a model checker to test safety properties

  • Author

    Ammann, Paul ; Ding, Wei ; Xu, Daling

  • Author_Institution
    ISE Dept., George Mason Univ., Fairfax, VA, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    212
  • Lastpage
    221
  • Abstract
    In addition to providing a sound basis for analysis, formal methods can support other development activities; in our case the target is specification-based testing at the system level. We use the formal method of model checking to either generate new test sets or analyze existing test sets with respect to safety properties expressed in a temporal logic. We consider two types of tests: failing tests, in which a system must reject (fail) a specific dangerous action, and passing tests, in which a system must accept (pass) a safe action in a context that also includes a plausible dangerous action. We formalize our notion of dangerous actions with a mutation model for model checking specifications, and we develop coverage criteria to assess test sets. The coverage criteria are based on the logic operators from the Computation Tree Logic (CTL) and encompass the idea of scenarios where a dangerous action is either inevitable (A) or possible (E) as of the next state (X) or at some point in the future (F). We demonstrate the feasibility of our approach with an example
  • Keywords
    formal specification; program testing; safety-critical software; temporal logic; trees (mathematics); Computation Tree Logic; coverage criteria; formal methods; formal specification; model checker; mutation model; safety critical software; safety property testing; software testing; specification-based testing; temporal logic; Acoustic testing; Aerospace engineering; Automatic testing; Genetic mutations; Logic testing; NIST; Software safety; Software testing; System testing; Traffic control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering of Complex Computer Systems, 2001. Proceedings. Seventh IEEE International Conference on
  • Conference_Location
    Skovde
  • Print_ISBN
    0-7695-1159-7
  • Type

    conf

  • DOI
    10.1109/ICECCS.2001.930180
  • Filename
    930180