DocumentCode :
3196348
Title :
Flexible test bench to study the reliability of electronic assemblies
Author :
Moreau, K. ; Grieu, Marc ; Bousquet, Sophie ; Munier, C.
fYear :
2010
fDate :
13-16 Sept. 2010
Firstpage :
1
Lastpage :
5
Abstract :
Robustness and reliability for electronic boards are key issues, especially in the aeronautics industry. To study the reliability of the assembly, accelerated tests are performed on daisy chain components assembled on Printed Circuit Board (PCB). Times to failure of components need to be accurately detected to propose relevant fatigue and reliability models. To electrically monitor the daisy chains, a flexible event detector has been developed by EADS Innovation Works. Its aim is to detect micro-events in a solder joint. Indeed, despite the crack initiation and propagation, the solder joint can still conduct electrical current intermittently. Nevertheless, the solder joint is not considered as reliable because it is not able to fulfill its function in any case. Firstly, this paper presents the characteristics of the flexible event detector. A part of the system records continuously micro-events, for a large number of channels. Then, a custom interface analyse the data recorded by the multi channels system to identify those which correspond to standards (such as IPC-SM-785) or a custom criteria. To illustrate this method and validate the event detector, some experimental vibration tests were performed. Several components electrically failed during the tests and were precisely detected by the flexible event detector. Finally, a comparative vibration testing is performed between a commercial event detector system and the EADS IW one to identify the detection capacities of each solution.
Keywords :
avionics; circuit reliability; crack detection; dynamic testing; flexible electronics; printed circuit testing; soldering; solders; EADS innovation works; PCB; aeronautics industry; crack initiation; crack propagation; custom interface; daisy chain components; electrical current; electronic assembly; electronic boards; fatigue; flexible event detector; flexible test bench; microevents; multichannels system; printed circuit board; reliability; robustness; solder joint; vibration tests; Electromagnetic interference; Lead; Levee; Materials; Resistance; Robustness; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic System-Integration Technology Conference (ESTC), 2010 3rd
Conference_Location :
Berlin
Print_ISBN :
978-1-4244-8553-6
Electronic_ISBN :
978-1-4244-8554-3
Type :
conf
DOI :
10.1109/ESTC.2010.5642810
Filename :
5642810
Link To Document :
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