Title :
Dielectric properties of natural materials
Author :
Oswald, B. ; Erni, D. ; Benedickter, H.R. ; Bachtold, W. ; Fluhler, H.
Author_Institution :
Lab. for Electromagn. Fields & Microwave Electron., Fed. Inst. of Technol., Zurich, Switzerland
Abstract :
We report a novel method for the determination of the dispersive dielectric properties of natural materials exhibiting high dielectric losses over a wide frequency range. Our method is based on a comparison between measured and calculated scattering parameters of a section of coaxial transmission line. We use a flexible, physically justified model for the behavior of the dielectric material whose parameters are estimated using a genetic algorithm (GA). Dielectric data is of great importance in a great number of applications like ground probing radar (GPR), time domain reflectrometry (TDR) for the determination of the volumetric water content and microwave based process tomography (/spl mu/PT), an emerging technology in process engineering applications.
Keywords :
S-parameters; coaxial cables; genetic algorithms; permittivity measurement; transmission lines; coaxial transmission line; dielectric loss; dielectric properties; dispersive dielectric properties; genetic algorithm; ground probing radar; microwave based process tomography; natural materials; process engineering; scattering parameters; time domain reflectrometry; volumetric water content; Coaxial components; Dielectric losses; Dielectric materials; Dielectric measurements; Dispersion; Frequency; Ground penetrating radar; Parameter estimation; Scattering parameters; Transmission line measurements;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1998. IEEE
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-4478-2
DOI :
10.1109/APS.1998.701600