Title :
On the integration of microwave curing systems into microelectronics assembly processes
Author :
Adamietz, Raphael ; Müller, G. ; Othman, N. ; Eicher, F. ; Tilford, T. ; Ferenets, M. ; Pavuluri, S.K. ; Desmulliez, M.P.Y. ; Bailey, Christopher
Author_Institution :
Fraunhofer Inst. fur Produktionstechnik und Automatisierung, Stuttgart, Germany
Abstract :
In microelectronics packaging applications a variety of thermosetting polymer materials is applied. Such materials are dispensed in a liquid form and are heated with the intent to cure them. Conventional processes often take several hours to bring the material up to temperatures which result in a significant rate of cure. An alternative approach to curing thermosetting polymers is the use of microwave energy, which has been shown to cure encapsulant materials in substantially shorter times. A recent innovation is the open-ended microwave oven proposed by Sinclair et al.. This paper deals with the implementation of the open-ended microwave oven into a precision placement machine. Two test products for encapsulation and flip-chip serve as objective for microwave-assisted assembly. An integrated system setup including the open ended oven is presented. Modifications on the open-ended microwave oven are described and a concept for the development of an embedded microwave curing system is presented. Tests on curing encapsulant materials dispensed over a commercially available QFN were performed to determine post-process functionality of the package, with no evident detrimental effects.
Keywords :
assembling; curing; electronics packaging; flip-chip devices; integrated circuits; microwave ovens; polymers; embedded microwave curing system; encapsulant material; flip-chip; integrated system; microelectronics assembly process; microelectronics packaging; microwave energy; microwave-assisted assembly; open-ended microwave oven; precision placement machine; thermosetting polymer curing; thermosetting polymer material; Curing; Electromagnetic heating; Microwave ovens; Microwave propagation; Ovens; Testing;
Conference_Titel :
Electronic System-Integration Technology Conference (ESTC), 2010 3rd
Conference_Location :
Berlin
Print_ISBN :
978-1-4244-8553-6
Electronic_ISBN :
978-1-4244-8554-3
DOI :
10.1109/ESTC.2010.5642827