• DocumentCode
    3196818
  • Title

    Diffraction by a two-part planar material junction-oblique incidence

  • Author

    Ly, H.C. ; Rojas, R.G. ; Pathak, P.H.

  • Author_Institution
    ElectroSci. Lab., Ohio State Univ., Columbus, OH, USA
  • fYear
    1992
  • fDate
    18-25 June 1992
  • Firstpage
    953
  • Abstract
    A uniform asymptotic solution to the problem of high-frequency diffraction by a planar junction of two thin material half-planes for the case of oblique incidence is developed. The generalized impedance boundary condition of O(t) has been employed to approximately characterize the electrically thin material slabs. The analysis is based on the Wiener-Hopf technique, where the factorization and decomposition of certain functions are expressed in relatively simple forms. The uniqueness of the solution is obtained by the determination of an additional junction condition from an approximated quasi-static analysis. The present analysis does not enforce reciprocity a priori yet obtains unique solutions which automatically satisfy reciprocity.<>
  • Keywords
    electromagnetic wave diffraction; Wiener-Hopf technique; approximated quasistatic analysis; decomposition; electrically thin material slabs; factorization; generalized impedance boundary condition; high-frequency diffraction; planar material junction-oblique incidence; thin material half-planes; uniform asymptotic solution; Boundary conditions; Conducting materials; Dielectrics; Diffraction; Electromagnetic scattering; Equations; Fourier transforms; Impedance; Polarization; Slabs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1992. AP-S. 1992 Digest. Held in Conjuction with: URSI Radio Science Meeting and Nuclear EMP Meeting., IEEE
  • Conference_Location
    Chicago, IL, USA
  • Print_ISBN
    0-7803-0730-5
  • Type

    conf

  • DOI
    10.1109/APS.1992.221793
  • Filename
    221793